This patch makes improvements to the way properties are printed when
in dtc is producing dts output.
- Characters which need escaping are now properly handled when
printing properties as strings
- The heuristics for what format to use for a property are
improved so that 'compatible' properties will be displayed as
expected.
- escapes.dts is altered to better demonstrate the changes,
and the string_escapes testcase is adjusted accordingly.
Signed-off-by: David Gibson <david@gibson.dropbear.id.au>
dtc supports the use of C-style escapes (\n, \t and so forth) in
string property definitions via the data_copy_escape_string()
function. However, while it supports the most common escape
characters, it doesn't support the full set that C does, which is a
potential gotcha.
Worse, a bug in the lexer means that while data_copy_escape_string()
can handle the \" escape, a string with such an escape won't lex
correctly.
This patch fixes both problems, extending data_copy_escape_string() to
support the missing escapes, and fixing the regex for strings in the
lexer to handle internal escaped quotes.
This also adds a testcase for string escape functionality.
Signed-off-by: David Gibson <david@gibson.dropbear.id.au>
This patch adds functions to libfdt for accessing the memory
reservation map section of a device tree blob. fdt_num_mem_rsv()
retreives the number of reservation entries in a dtb, and
fdt_get_mem_rsv() retreives a specific reservation entry.
fdt_add_mem_rsv() adds a new entry, and fdt_del_mem_rsv() removes a
specific numbered entry.
Testcases for these new functions are also included.
Signed-off-by: David Gibson <david@gibson.dropbear.id.au>
Flat device trees always have integers in their structure stored as
big-endian. From this point of view, property values are
bags-of-bytes and any endianness is up to users of the device tree to
determine.
The libfdt testcases which use properties with integer values,
currently use native endian format for the architecture on which the
testcases are run. This works ok for now, since both the creation and
checking of the example device trees happen in the same endianness.
This will become a problem, however, for tests of dtc which we want to
add in the nearish future. dtc always uses big-endian format for
'cell' format data in properties; as it needs to in order to produce
powerpc-usable device trees when hosted on a little-endian
architecture.
This patch, therefore, changes the libfdt testsuite to use big-endian
format always for integer format data, in order to interoperate sanely
with future dtc testcases. This also means that the example trees
created by the testsuite should now be byte-for-byte identical
regardless of dtc and libfdt's host platform, which is arguably an
advantage.
Signed-off-by: David Gibson <david@gibson.dropbear.id.au>
The libfdt functions are supposed to behave tolerably well when practical,
even if given a corrupted device tree as input. A silly mistake in
fdt_get_property() means we're bounds checking against the size of a pointer
instead of the size of a property header, meaning we can get bogus
behaviour in a corrupted device tree where the structure block ends in
what's supposed to be the middle of a property.
This patch corrects the problem (fdt_get_property() will now return
BADSTRUCTURE in this case), and also adds a testcase to catch the bug.
David Gibson