dtc/tests/testdata.h

#include <endian.h>

#if __BYTE_ORDER == __BIG_ENDIAN
#define cell_to_fdt(x)	(x)
#else
/* We do this as a big hairy expression instead of using bswap_32()
 * because we need it to work in asm as well as C. */
#define cell_to_fdt(x)	((((x) >> 24) & 0xff) | (((x) >> 8) & 0xff00) \
			 | (((x) << 8) & 0xff0000) | (((x) << 24) & 0xff000000))
#endif

#define TEST_VALUE_1	cell_to_fdt(0xdeadbeef)
#define TEST_VALUE_2	cell_to_fdt(0xabcd1234)

#define TEST_STRING_1	"hello world"

#ifndef __ASSEMBLY__
extern struct fdt_header _test_tree1;
extern struct fdt_header _truncated_property;
#endif /* ! __ASSEMBLY */
libfdt: Consistently use big-endian property data in testcases Flat device trees always have integers in their structure stored as big-endian. From this point of view, property values are bags-of-bytes and any endianness is up to users of the device tree to determine. The libfdt testcases which use properties with integer values, currently use native endian format for the architecture on which the testcases are run. This works ok for now, since both the creation and checking of the example device trees happen in the same endianness. This will become a problem, however, for tests of dtc which we want to add in the nearish future. dtc always uses big-endian format for 'cell' format data in properties; as it needs to in order to produce powerpc-usable device trees when hosted on a little-endian architecture. This patch, therefore, changes the libfdt testsuite to use big-endian format always for integer format data, in order to interoperate sanely with future dtc testcases. This also means that the example trees created by the testsuite should now be byte-for-byte identical regardless of dtc and libfdt's host platform, which is arguably an advantage. Signed-off-by: David Gibson <david@gibson.dropbear.id.au> 18 years ago			`#include <endian.h>`

			`#if __BYTE_ORDER == __BIG_ENDIAN`
			`#define cell_to_fdt(x) (x)`
			`#else`
			`/* We do this as a big hairy expression instead of using bswap_32()`
			`* because we need it to work in asm as well as C. */`
			`#define cell_to_fdt(x) ((((x) >> 24) & 0xff) \| (((x) >> 8) & 0xff00) \`
			`\| (((x) << 8) & 0xff0000) \| (((x) << 24) & 0xff000000))`
			`#endif`

			`#define TEST_VALUE_1 cell_to_fdt(0xdeadbeef)`
			`#define TEST_VALUE_2 cell_to_fdt(0xabcd1234)`
libfdt - library for manipulating device trees in flattened format Initial revision, read-only and "in-place" (no memmove() required) write operations only. 18 years ago
			`#define TEST_STRING_1 "hello world"`

			`#ifndef __ASSEMBLY__`
			`extern struct fdt_header _test_tree1;`
libfdt: Fix bounds-checking bug in fdt_get_property() The libfdt functions are supposed to behave tolerably well when practical, even if given a corrupted device tree as input. A silly mistake in fdt_get_property() means we're bounds checking against the size of a pointer instead of the size of a property header, meaning we can get bogus behaviour in a corrupted device tree where the structure block ends in what's supposed to be the middle of a property. This patch corrects the problem (fdt_get_property() will now return BADSTRUCTURE in this case), and also adds a testcase to catch the bug. 18 years ago			`extern struct fdt_header _truncated_property;`
libfdt - library for manipulating device trees in flattened format Initial revision, read-only and "in-place" (no memmove() required) write operations only. 18 years ago			`#endif /* ! __ASSEMBLY */`