With -Wsign-compare, compilers warn about a mismatching signedness in
comparisons in various files in the tests/ directory.
For about half of the cases we can simply change the signed variable to
be of an unsigned type, because they will never need to store negative
values (which is the best fix of the problem).
In the remaining cases we can cast the signed variable to an unsigned
type, provided we know for sure it is not negative.
We see two different scenarios here:
- We either just explicitly checked for this variable to be positive
(if (rc < 0) FAIL();), or
- We rely on a function returning only positive values in the "length"
pointer if the function returned successfully: which we just checked.
At two occassions we compare with a constant "-1" (even though the
variable is unsigned), so we just change this to ~0U to create an
unsigned comparison value.
Since this is about the tests, let's also add explicit tests for those
values really not being negative.
This fixes "make tests" (but not "make check" yet), when compiled
with -Wsign-compare.
Signed-off-by: Andre Przywara <andre.przywara@arm.com>
Message-Id: <20210618172030.9684-2-andre.przywara@arm.com>
Signed-off-by: David Gibson <david@gibson.dropbear.id.au>
Replace instances in tests of mostly LGPL-2.1 license boilerplate
with SPDX tags.
Signed-off-by: Rob Herring <robh@kernel.org>
Message-Id: <20190620211944.9378-5-robh@kernel.org>
Signed-off-by: David Gibson <david@gibson.dropbear.id.au>
This fixes a great many sparse warnings on the fdt and libfdt sources.
These are mostly due to incorrect mixing of endian annotated and native
integer types.
This includes fixing a couple of quasi-bugs where we had endian conversions
the wrong way around (this will have the right effect in practice, but is
certainly conceptually incorrect).
This doesn't make the whole tree sparse clean: there are many warnings in
bison and lex generated code, and there are a handful of other remaining
warnings that are (for now) more trouble than they're worth to fix (and
are not genuine bugs).
Signed-off-by: David Gibson <david@gibson.dropbear.id.au>
Implement a macro based on fdt_first_property_offset and
fdt_next_property_offset that provides a convenience to iterate over all
the properties of a given node.
Signed-off-by: Maxime Ripard <maxime.ripard@free-electrons.com>
Acked-by: Simon Glass <sjg@chromium.org>
[dwg: Removed a stray trailing blank line]
Signed-off-by: David Gibson <david@gibson.dropbear.id.au>
The fdt_for_each_subnode() iterator macro provided by this patch can be
used to iterate over a device tree node's subnodes. At each iteration a
loop variable will be set to the next subnode.
Signed-off-by: Thierry Reding <treding@nvidia.com>
Signed-off-by: Maxime Ripard <maxime.ripard@free-electrons.com>
Signed-off-by: David Gibson <david@gibson.dropbear.id.au>
Iterating through subnodes with libfdt is a little painful to write as we
need something like this:
for (depth = 0, count = 0,
offset = fdt_next_node(fdt, parent_offset, &depth);
(offset >= 0) && (depth > 0);
offset = fdt_next_node(fdt, offset, &depth)) {
if (depth == 1) {
/* code body */
}
}
Using fdt_next_subnode() we can instead write this, which is shorter and
easier to get right:
for (offset = fdt_first_subnode(fdt, parent_offset);
offset >= 0;
offset = fdt_next_subnode(fdt, offset)) {
/* code body */
}
Also, it doesn't require two levels of indentation for the loop body.
Signed-off-by: Simon Glass <sjg@chromium.org>
Acked-by: David Gibson <david@gibson.dropbear.id.au>
Andre Przywara